TTTC's
Electronic Broadcasting Service |
IEEE Defect and Data-Driven Testing |
SUBMISSION DEADLINE EXTENDED: SEPTEMBER 4th, 2009! |
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CALL
FOR PAPERS |
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As technology scales, various new types of defects are presenting unique challenges to the test community. New test defect and data based methodologies are required to detect, monitor, and comprehend the various defect mechanisms at sub-90nm technology nodes and their impact on product quality and in-field reliability. Defect and data-driven testing (D3T) has been in practice for a number of years and often used for yield learning and analysis. It is now gaining attention more than ever in production test. D3T uses data to reduce defect levels, increase reliability, and to diagnose and solve yield problems. D3T can provide feedbacks on which tests to add/remove, or test subsets. It can also be utilized for improving quality of logic test patterns vs. outlier analysis tests. However, test data has not been easily accessible by smaller companies and researchers in academia. The IEEE International Workshop on Defect and Data-Driven Testing (D3T 2009) is aimed at addressing the above issues. Paper presentations on topics related to the topics listed below are expected to generate active discussion on the challenges that must be met to ensure high IC quality through the end of the decade.
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To present at the workshop, submit a postscript or Acrobat (PDF) version of an extended abstract of at least 1000 words via e-mail to the Program Chair by Aug. 21, 2009. Each submission should include full name and address of each author, affiliation, telephone number, fax and e-mail address. The presenter should also be identified. Camera-ready papers for inclusion in the digest of papers will be due on Sept. 26, 2009. Presentations on cutting edge test technology, innovative test ideas, and industrial practices and experience are welcome. Proposals for embedded tutorials, debates, panel discussions or “spot-light” presentations describing industrial experiences are also invited.
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Submission deadline: September 4, 2009 |
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Additional Information | |||
Go to: http://d3t.tttc-events.org/ |
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Committees | |||
Organizing Committee General Chair Program Chair Vice Program Chair Finance Chair Publicity Chair Publication Chair Steering Committee Sankaran Menon, Intel Program Committee Rob Aitken, ARM |
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For
more information, visit us on the web at: http://d3t.tttc-events.org/ |
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The Defect and Data-Driven Testing (D3T 2009) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
IEEE
Computer Society- Test Technology Technical Council |
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